माड्यूल SN74BCT8244ADWR : IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUFFERS

इसी प्रकार केSN74BCT8244ADWR

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- DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET
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- QUADRUPLE 2-INPUT POSITIVE-NOR GATES

SN74BCT8244ADWR Datasheet और माड्यूल

निर्माता : TI

पैकिंग : DW

पिन : 24

तापमान : न्यूनतम 0 °C | अधिकतम 70 °C

आकार : 322 KB

अनुप्रयोग : IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL BUFFERS